1～6 item / All 6 items
![[Measurement Field] Thermal Conductivity of Thin Films [TM3]](https://image.mono.ipros.com/public/product/image/64f/2001216600/IPROS18257629394415334480.jpeg?w=280&h=280)
For measuring thermal properties of thin films and micro-regions. Evaluation of heat-resistant coatings for structural components is possible.
The Thermal Microscope TM3 deposits a metal thin film on the sample and periodically heats it using a heating laser. It allows for the evaluation of heat-resistant coatings for structural components. For more details, please contact us.
Understanding the mechanism of heat transfer and effectively dissipating heat is important! Here we introduce various methods for measuring thermal properties.
Due to factors such as "miniaturization = fanless design" and "widespread use of power devices = increased heat generation," thermal issues have become important. Thermal conductivity measurement can be broadly classified into two categories: "steady-state method" and "transient method." The steady-state method provides direct thermal conductivity values and requires relatively large samples. The transient method can measure thermal diffusivity and thermal effusivity, and it is possible to measure with relatively small samples. We provide further detailed explanations, so please take a look at the PDF download below. 【Characteristics of the "Steady-State Method" and "Transient Method"】 ■ Steady-State Method - Direct thermal conductivity can be obtained - Requires relatively large samples ■ Transient Method - Can measure thermal diffusivity and thermal effusivity - Can measure with relatively small samples - Requires specific heat capacity and density *For more details, please refer to the PDF document or feel free to contact us.
Explanation of the principles of spot periodic heating radiation thermometry and the measurement devices!
This document explains the "principle and device configuration of the thermo-wave analyzer." It also includes features such as "high freedom of sample shape" and "ability to measure relatively thin samples." This technical document is recommended for those who want to understand the device from the principle. Please feel free to download and take a look. 【Contents】 ■ Introduction ■ Principle of spot periodic heating radiation thermometry ■ Measurement device ■ Measurement of thermal diffusivity of certified standard materials ■ Summary ■ References *For more details, please refer to the PDF document or feel free to contact us.
Equipped with pressure and thickness control functions! Suitable for thermal interface materials.
We aim to develop the optimal device for measuring thermal interface materials (TIM) used in semiconductor device heat dissipation. The steady-state thermal conductivity measurement device "SS-H40" is equipped with two measurement modes: "constant load mode" and "constant thickness mode," allowing for the evaluation of TIM in real-world usage conditions. In "constant load mode," measurements can be taken at a set load (units: N or Pa). On the other hand, "constant thickness mode" allows for measurements at a set thickness (units: mm). This enables measurements tailored to the usage environment, allowing for the assessment of whether the obtained thermal conductivity meets specifications. Furthermore, the measurement time, which previously took several hours, has been reduced to 10-20 minutes, making the process easier. 〇 About the Measurement Principle 〇 This is a steady-state measurement method. The steady-state method involves applying a constant amount of heat to the material, measuring the temperature gradient when the heat is stable, and determining the thermal conductivity of the material. This method maintains a steady-state heat flow, allowing for accurate measurements. It is a widely used measurement technique.
This is a recommended technical document for those who want to understand the principle of steady-state thermal conductivity measurement devices!
This document explains the "Principle and Device Configuration of the Steady-State Thermal Conductivity Measurement Device SS-H40." As principles of the steady-state method, it introduces the "Guarded Hot Plate Method" and the "Comparative Method," and also explains the features of the measurement device and its configuration. This technical document is recommended for those who want to understand the device from its principles. Please feel free to download and view it. 【Contents】 ■ Introduction ■ Principles of the Steady-State Method ■ Measurement Device ■ Examples of Thermal Conductivity Measurement ■ Conclusion ■ References *For more details, please refer to the PDF document or feel free to contact us.
![[Measurement Example] <LED Material> Measurement of Thermal Conductivity of Gallium Nitride (GaN)](https://image.mono.ipros.com/public/product/image/9a6/2001216793/IPROS35316899154734522910.jpeg?w=280&h=280)
Thermal evaluation of gallium nitride, known for blue LEDs and semiconductor materials!!
■Evaluation of particles with a micro size (3μm and above) ■Evaluation of thermal conductivity of thin films ■Measurement possible at submicron order
